HE2301-4126

taken from 2 paper(s):

/P.S.Barklem et al.(2005)/ /L.Zhang et al.(2011)/


P.S.Barklem et al.,AAP, 439, 129, 2005(ADS)

The Hamburg/ESO R-process enhanced star survey (HERES). II. Spectroscopic analysis of the survey sample


Stellar Parameters

Teff : 5841 log g : 3.66 vturb : 1.53

Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CH1...0.39+-0.276.41+-0.24-2.02+-0.240.35+-0.276.41+-0.24CH
Mg I4...0.22+-0.245.43+-0.17-2.17+-0.170.20+-0.245.43+-0.17Mg I
Al I1...-0.92+-0.253.18+-0.22-3.27+-0.22-0.90+-0.253.18+-0.22Al I
Ca I7...0.20+-0.254.19+-0.20-2.15+-0.200.22+-0.254.19+-0.20Ca I
Sc II4...0.16+-0.250.97+-0.23-2.18+-0.230.19+-0.250.97+-0.23Sc II
Ti8...0.28+-0.232.94+-0.21-2.01+-0.210.36+-0.232.94+-0.21Ti
Cr I3...-0.15+-0.233.15+-0.22-2.49+-0.22-0.12+-0.233.15+-0.22Cr I
Mn I2...-0.51+-0.232.51+-0.20-2.92+-0.20-0.55+-0.232.51+-0.20Mn I
Fe42...0.00+-0.225.13+-0.19-2.37+-0.190.00+-0.225.13+-0.19Fe
Co I2...0.10+-0.252.66+-0.21-2.33+-0.210.04+-0.252.66+-0.21Co I
Ni I3...-0.07+-0.233.81+-0.23-2.41+-0.23-0.04+-0.233.81+-0.23Ni I
Sr2...-0.08+-0.280.53+-0.30-2.34+-0.300.03+-0.280.53+-0.30Sr
Y II1...-0.02+-0.26-0.15+-0.24-2.36+-0.240.01+-0.26-0.15+-0.24Y II
Ba II1...0.11+-0.25-0.13+-0.25-2.31+-0.250.06+-0.25-0.13+-0.25Ba II

Position

Right Ascension : 23 03 50.18 Declination : -41 10 26.2 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 55 N/A 252.2

L.Zhang et al.,AAP, 528, A92, 2011(ADS)

The Hamburg/ESO R-process Enhanced Star survey (HERES). VI. The Galactic chemical evolution of silicon


Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CN/A-2.010.366.51-1.920.456.51C
FeN/A-2.37......-2.37...5.13Fe

Position

Right Ascension : 23 03 50.18 Declination : -41 10 26.2 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 N/A N/A N/A