HE2228-3806

taken from 2 paper(s):

/P.S.Barklem et al.(2005)/ /L.Zhang et al.(2011)/


P.S.Barklem et al.,AAP, 439, 129, 2005(ADS)

The Hamburg/ESO R-process enhanced star survey (HERES). II. Spectroscopic analysis of the survey sample


Stellar Parameters

Teff : 5175 log g : 2.62 vturb : 1.65

Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CH1...0.42+-0.275.74+-0.26-2.69+-0.260.38+-0.275.74+-0.26CH
Mg I4...0.33+-0.244.84+-0.19-2.76+-0.190.31+-0.244.84+-0.19Mg I
Al I1...-0.97+-0.252.43+-0.22-4.02+-0.22-0.95+-0.252.43+-0.22Al I
Ca I7...0.35+-0.253.64+-0.20-2.70+-0.200.37+-0.253.64+-0.20Ca I
Sc II4...0.12+-0.250.23+-0.23-2.92+-0.230.15+-0.250.23+-0.23Sc II
Ti10...0.30+-0.242.25+-0.22-2.70+-0.220.37+-0.242.25+-0.22Ti
Cr I3...-0.43+-0.232.17+-0.21-3.47+-0.21-0.40+-0.232.17+-0.21Cr I
Mn I3...-0.74+-0.231.58+-0.21-3.85+-0.21-0.78+-0.231.58+-0.21Mn I
Fe40...0.00+-0.224.43+-0.18-3.07+-0.180.00+-0.224.43+-0.18Fe
Co I5...0.30+-0.242.15+-0.22-2.84+-0.220.23+-0.242.15+-0.22Co I
Ni I4...-0.07+-0.243.11+-0.24-3.11+-0.24-0.04+-0.243.11+-0.24Ni I
Sr2...-0.19+-0.31-0.29+-0.32-3.16+-0.32-0.09+-0.31-0.29+-0.32Sr
Y II1...-0.20+-0.26-1.03+-0.24-3.24+-0.24-0.17+-0.26-1.03+-0.24Y II
Ba II1...-0.57+-0.25-1.51+-0.24-3.69+-0.24-0.62+-0.25-1.51+-0.24Ba II

Position

Right Ascension : 22 31 02.57 Declination : -37 50 40.7 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 50 N/A 179.0

L.Zhang et al.,AAP, 528, A92, 2011(ADS)

The Hamburg/ESO R-process Enhanced Star survey (HERES). VI. The Galactic chemical evolution of silicon


Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CN/A-2.730.345.79-2.640.435.79C
FeN/A-3.07......-3.07...4.43Fe

Position

Right Ascension : 22 31 02.57 Declination : -37 50 40.7 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 N/A N/A N/A