HE1419-1759

taken from 2 paper(s):

/P.S.Barklem et al.(2005)/ /L.Zhang et al.(2011)/


P.S.Barklem et al.,AAP, 439, 129, 2005(ADS)

The Hamburg/ESO R-process enhanced star survey (HERES). II. Spectroscopic analysis of the survey sample


Stellar Parameters

Teff : 4809 log g : 1.63 vturb : 1.83

Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CH1...-0.20+-0.295.02+-0.27-3.41+-0.27-0.24+-0.295.02+-0.27CH
Mg I5...0.27+-0.234.68+-0.18-2.92+-0.180.25+-0.234.68+-0.18Mg I
Al I1...-0.95+-0.282.34+-0.26-4.11+-0.26-0.94+-0.282.34+-0.26Al I
Ca I7...0.29+-0.253.47+-0.20-2.87+-0.200.30+-0.253.47+-0.20Ca I
Sc II4...0.07+-0.240.07+-0.22-3.08+-0.220.09+-0.240.07+-0.22Sc II
Ti12...0.13+-0.231.98+-0.21-2.97+-0.210.20+-0.231.98+-0.21Ti
Cr I3...-0.48+-0.232.02+-0.23-3.62+-0.23-0.45+-0.232.02+-0.23Cr I
Mn I3...-0.92+-0.231.30+-0.21-4.13+-0.21-0.96+-0.231.30+-0.21Mn I
Fe46...0.00+-0.224.33+-0.18-3.17+-0.180.00+-0.224.33+-0.18Fe
Co I6...0.15+-0.251.89+-0.22-3.10+-0.220.07+-0.251.89+-0.22Co I
Ni I4...0.00+-0.263.07+-0.27-3.15+-0.270.02+-0.263.07+-0.27Ni I
Sr2...-0.26+-0.34-0.47+-0.36-3.34+-0.36-0.17+-0.34-0.47+-0.36Sr
Y II2...-0.54+-0.25-1.48+-0.24-3.69+-0.24-0.52+-0.25-1.48+-0.24Y II
Ba II1...-0.81+-0.25-1.85+-0.23-4.03+-0.23-0.86+-0.25-1.85+-0.23Ba II

Position

Right Ascension : 14 22 17.70 Declination : -18 13 29.5 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 45 N/A 201.4

L.Zhang et al.,AAP, 528, A92, 2011(ADS)

The Hamburg/ESO R-process Enhanced Star survey (HERES). VI. The Galactic chemical evolution of silicon


Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CN/A-3.48-0.305.04-3.39-0.215.04C
FeN/A-3.18......-3.18...4.32Fe

Position

Right Ascension : 14 22 17.70 Declination : -18 13 29.5 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 N/A N/A N/A