HE1243-1425

taken from 2 paper(s):

/P.S.Barklem et al.(2005)/ /L.Zhang et al.(2011)/


P.S.Barklem et al.,AAP, 439, 129, 2005(ADS)

The Hamburg/ESO R-process enhanced star survey (HERES). II. Spectroscopic analysis of the survey sample


Stellar Parameters

Teff : 5507 log g : 3.19 vturb : 1.11

Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CH1...0.51+-0.276.23+-0.25-2.20+-0.250.47+-0.276.23+-0.25CH
Mg I2...0.22+-0.245.13+-0.18-2.47+-0.180.20+-0.245.13+-0.18Mg I
Al I1...-1.06+-0.262.74+-0.23-3.71+-0.23-1.04+-0.262.74+-0.23Al I
Ca I7...0.20+-0.253.89+-0.20-2.45+-0.200.22+-0.253.89+-0.20Ca I
Sc II4...0.26+-0.260.76+-0.23-2.39+-0.230.28+-0.260.76+-0.23Sc II
Ti9...0.25+-0.242.60+-0.21-2.35+-0.210.32+-0.242.60+-0.21Ti
Cr I3...-0.25+-0.242.76+-0.23-2.88+-0.23-0.21+-0.242.76+-0.23Cr I
Mn I3...-0.89+-0.241.83+-0.20-3.60+-0.20-0.93+-0.241.83+-0.20Mn I
Fe38...0.00+-0.224.83+-0.18-2.67+-0.180.00+-0.224.83+-0.18Fe
Co I4...0.33+-0.252.58+-0.22-2.41+-0.220.26+-0.252.58+-0.22Co I
Ni I3...0.43+-0.254.01+-0.27-2.21+-0.270.46+-0.254.01+-0.27Ni I
Sr1...0.23+-0.270.54+-0.28-2.33+-0.280.34+-0.270.54+-0.28Sr
Y II1...0.28+-0.27-0.14+-0.24-2.35+-0.240.32+-0.27-0.14+-0.24Y II
Ba II1...-0.41+-0.27-0.94+-0.24-3.12+-0.24-0.45+-0.27-0.94+-0.24Ba II

Position

Right Ascension : 12 46 28.07 Declination : -14 41 33.6 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 50 N/A 41.8

L.Zhang et al.,AAP, 528, A92, 2011(ADS)

The Hamburg/ESO R-process Enhanced Star survey (HERES). VI. The Galactic chemical evolution of silicon


Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CN/A-2.270.406.25-2.180.496.25C
FeN/A-2.67......-2.67...4.83Fe

Position

Right Ascension : 12 46 28.07 Declination : -14 41 33.6 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 N/A N/A N/A