HE0401-0138

taken from 2 paper(s):

/P.S.Barklem et al.(2005)/ /L.Zhang et al.(2011)/


P.S.Barklem et al.,AAP, 439, 129, 2005(ADS)

The Hamburg/ESO R-process enhanced star survey (HERES). II. Spectroscopic analysis of the survey sample


Stellar Parameters

Teff : 4866 log g : 1.76 vturb : 1.45

Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CH1...0.24+-0.285.30+-0.27-3.13+-0.270.21+-0.285.30+-0.27CH
Mg I5...0.42+-0.234.67+-0.19-2.93+-0.190.41+-0.234.67+-0.19Mg I
Al I1...-1.06+-0.252.07+-0.21-4.38+-0.21-1.04+-0.252.07+-0.21Al I
Ca I6...0.35+-0.253.37+-0.20-2.97+-0.200.37+-0.253.37+-0.20Ca I
Sc II4...0.11+-0.25-0.06+-0.23-3.21+-0.230.13+-0.25-0.06+-0.23Sc II
Ti10...0.28+-0.231.97+-0.21-2.98+-0.210.36+-0.231.97+-0.21Ti
Cr I3...-0.46+-0.231.87+-0.22-3.77+-0.22-0.43+-0.231.87+-0.22Cr I
Mn I3...-0.80+-0.231.25+-0.20-4.18+-0.20-0.84+-0.231.25+-0.20Mn I
Fe41...0.00+-0.224.16+-0.18-3.34+-0.180.00+-0.224.16+-0.18Fe
Co I5...0.24+-0.241.82+-0.22-3.17+-0.220.17+-0.241.82+-0.22Co I
Ni I4...0.02+-0.262.94+-0.26-3.28+-0.260.06+-0.262.94+-0.26Ni I
Sr2...0.11+-0.33-0.26+-0.35-3.13+-0.350.21+-0.33-0.26+-0.35Sr
Y II2...0.05+-0.25-1.05+-0.23-3.26+-0.230.08+-0.25-1.05+-0.23Y II
Ba II1...-0.21+-0.25-1.41+-0.25-3.59+-0.25-0.25+-0.25-1.41+-0.25Ba II

Position

Right Ascension : 04 03 49.88 Declination : -01 30 02.5 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 56 N/A 137.4

L.Zhang et al.,AAP, 528, A92, 2011(ADS)

The Hamburg/ESO R-process Enhanced Star survey (HERES). VI. The Galactic chemical evolution of silicon


Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CN/A-3.140.205.38-3.050.295.38C
FeN/A-3.34......-3.34...4.16Fe

Position

Right Ascension : 04 03 49.88 Declination : -01 30 02.5 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 N/A N/A N/A