HE0200-0955

taken from 2 paper(s):

/P.S.Barklem et al.(2005)/ /L.Zhang et al.(2011)/


P.S.Barklem et al.,AAP, 439, 129, 2005(ADS)

The Hamburg/ESO R-process enhanced star survey (HERES). II. Spectroscopic analysis of the survey sample


Stellar Parameters

Teff : 5216 log g : 2.57 vturb : 1.79

Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CH1...0.41+-0.276.34+-0.26-2.09+-0.260.38+-0.276.34+-0.26CH
Mg I6...0.34+-0.245.45+-0.18-2.15+-0.180.32+-0.245.45+-0.18Mg I
Al I1...-0.93+-0.273.07+-0.26-3.38+-0.26-0.91+-0.273.07+-0.26Al I
Ca I8...0.30+-0.254.19+-0.20-2.15+-0.200.32+-0.254.19+-0.20Ca I
Sc II4...0.04+-0.230.75+-0.20-2.40+-0.200.07+-0.230.75+-0.20Sc II
Ti14...0.17+-0.232.73+-0.21-2.22+-0.210.25+-0.232.73+-0.21Ti
Cr I3...-0.19+-0.263.02+-0.27-2.62+-0.27-0.15+-0.263.02+-0.27Cr I
Mn I3...-0.36+-0.232.56+-0.22-2.87+-0.22-0.40+-0.232.56+-0.22Mn I
Fe48...0.00+-0.225.03+-0.19-2.47+-0.190.00+-0.225.03+-0.19Fe
Co I5...0.16+-0.242.62+-0.23-2.37+-0.230.10+-0.242.62+-0.23Co I
Ni I4...-0.20+-0.263.58+-0.27-2.64+-0.27-0.17+-0.263.58+-0.27Ni I
Sr2...-0.36+-0.310.14+-0.33-2.73+-0.33-0.26+-0.310.14+-0.33Sr
Y II2...-0.32+-0.26-0.54+-0.24-2.75+-0.24-0.28+-0.26-0.54+-0.24Y II
Ba II1...-0.68+-0.26-1.02+-0.25-3.20+-0.25-0.73+-0.26-1.02+-0.25Ba II

Position

Right Ascension : 02 03 16.21 Declination : -09 40 48.8 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 39 N/A 73.6

L.Zhang et al.,AAP, 528, A92, 2011(ADS)

The Hamburg/ESO R-process Enhanced Star survey (HERES). VI. The Galactic chemical evolution of silicon


Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CN/A-2.180.286.34-2.090.376.34C
FeN/A-2.46......-2.46...5.04Fe

Position

Right Ascension : 02 03 16.21 Declination : -09 40 48.8 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 N/A N/A N/A