HE0143-4146

taken from 2 paper(s):

/P.S.Barklem et al.(2005)/ /L.Zhang et al.(2011)/


P.S.Barklem et al.,AAP, 439, 129, 2005(ADS)

The Hamburg/ESO R-process enhanced star survey (HERES). II. Spectroscopic analysis of the survey sample


Stellar Parameters

Teff : 4799 log g : 1.50 vturb : 2.03

Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CH1...0.11+-0.285.55+-0.27-2.88+-0.270.07+-0.285.55+-0.27CH
Mg I7...0.41+-0.235.04+-0.19-2.56+-0.190.39+-0.235.04+-0.19Mg I
Al I1...-0.61+-0.302.92+-0.29-3.53+-0.29-0.58+-0.302.92+-0.29Al I
Ca I7...0.25+-0.253.67+-0.20-2.67+-0.200.28+-0.253.67+-0.20Ca I
Sc II5...0.38+-0.250.60+-0.23-2.55+-0.230.40+-0.250.60+-0.23Sc II
Ti15...0.36+-0.232.43+-0.21-2.52+-0.210.43+-0.232.43+-0.21Ti
Cr I3...-0.20+-0.262.52+-0.26-3.12+-0.26-0.17+-0.262.52+-0.26Cr I
Mn I3...-0.13+-0.242.31+-0.22-3.12+-0.22-0.17+-0.242.31+-0.22Mn I
Fe49...0.00+-0.224.55+-0.18-2.95+-0.180.00+-0.224.55+-0.18Fe
Co I6...0.28+-0.242.26+-0.22-2.73+-0.220.22+-0.242.26+-0.22Co I
Ni I4...0.03+-0.283.34+-0.29-2.88+-0.290.07+-0.283.34+-0.29Ni I
Sr2...-0.62+-0.32-0.60+-0.34-3.47+-0.34-0.52+-0.32-0.60+-0.34Sr
Y II1...-0.66+-0.25-1.37+-0.23-3.58+-0.23-0.63+-0.25-1.37+-0.23Y II
Ba II1...-0.79+-0.25-1.61+-0.24-3.79+-0.24-0.84+-0.25-1.61+-0.24Ba II

Position

Right Ascension : 01 45 18.03 Declination : -41 31 46.4 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 45 N/A -16.3

L.Zhang et al.,AAP, 528, A92, 2011(ADS)

The Hamburg/ESO R-process Enhanced Star survey (HERES). VI. The Galactic chemical evolution of silicon


Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CN/A-2.880.065.64-2.790.155.64C
FeN/A-2.94......-2.94...4.56Fe

Position

Right Ascension : 01 45 18.03 Declination : -41 31 46.4 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 N/A N/A N/A