HE0017-4838

taken from 2 paper(s):

/P.S.Barklem et al.(2005)/ /L.Zhang et al.(2011)/


P.S.Barklem et al.,AAP, 439, 129, 2005(ADS)

The Hamburg/ESO R-process enhanced star survey (HERES). II. Spectroscopic analysis of the survey sample


Stellar Parameters

Teff : 5149 log g : 2.23 vturb : 1.81

Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CH1...-0.29+-0.334.87+-0.31-3.56+-0.31-0.33+-0.334.87+-0.31CH
Mg I3...0.25+-0.244.60+-0.19-3.00+-0.190.23+-0.244.60+-0.19Mg I
Al I1...-0.89+-0.262.35+-0.23-4.10+-0.23-0.87+-0.262.35+-0.23Al I
Ca I3...0.27+-0.253.40+-0.20-2.94+-0.200.29+-0.253.40+-0.20Ca I
Sc II3...0.23+-0.250.17+-0.23-2.98+-0.230.25+-0.250.17+-0.23Sc II
Ti8...0.36+-0.242.15+-0.22-2.80+-0.220.43+-0.242.15+-0.22Ti
Cr I3...-0.37+-0.232.06+-0.21-3.58+-0.21-0.35+-0.232.06+-0.21Cr I
Mn I3...-0.58+-0.231.58+-0.21-3.85+-0.21-0.62+-0.231.58+-0.21Mn I
Fe34...0.00+-0.224.27+-0.18-3.23+-0.180.00+-0.224.27+-0.18Fe
Co I4...0.32+-0.252.01+-0.22-2.98+-0.220.25+-0.252.01+-0.22Co I
Ni I4...0.17+-0.243.18+-0.24-3.04+-0.240.19+-0.243.18+-0.24Ni I
Sr2...0.68+-0.300.42+-0.31-2.45+-0.310.78+-0.300.42+-0.31Sr
Y II3...0.34+-0.25-0.65+-0.24-2.86+-0.240.37+-0.25-0.65+-0.24Y II
Ba II1...-0.78+-0.26-1.88+-0.24-4.06+-0.24-0.83+-0.26-1.88+-0.24Ba II

Position

Right Ascension : 00 19 48.32 Declination : -48 21 23.6 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 42 N/A 26.8

L.Zhang et al.,AAP, 528, A92, 2011(ADS)

The Hamburg/ESO R-process Enhanced Star survey (HERES). VI. The Galactic chemical evolution of silicon


Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CN/A-3.130.105.39-3.040.195.39C
FeN/A-3.23......-3.23...4.27Fe

Position

Right Ascension : 00 19 48.32 Declination : -48 21 23.6 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 N/A N/A N/A