HE0330-4004

taken from 2 paper(s):

/P.S.Barklem et al.(2005)/ /L.Zhang et al.(2011)/


P.S.Barklem et al.,AAP, 439, 129, 2005(ADS)

The Hamburg/ESO R-process enhanced star survey (HERES). II. Spectroscopic analysis of the survey sample


Stellar Parameters

Teff : 5946 log g : 3.78 vturb : 1.53

Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CH1...0.08+-0.286.28+-0.24-2.15+-0.240.04+-0.286.28+-0.24CH
Mg I4...0.25+-0.235.63+-0.18-1.97+-0.180.22+-0.235.63+-0.18Mg I
Al I1...-0.99+-0.263.29+-0.23-3.16+-0.23-0.97+-0.263.29+-0.23Al I
Ca I8...0.38+-0.254.54+-0.20-1.80+-0.200.39+-0.254.54+-0.20Ca I
Sc II4...0.20+-0.261.18+-0.23-1.97+-0.230.22+-0.261.18+-0.23Sc II
Ti10...0.36+-0.243.19+-0.21-1.76+-0.210.43+-0.243.19+-0.21Ti
Cr I3...-0.14+-0.243.34+-0.23-2.30+-0.23-0.11+-0.243.34+-0.23Cr I
Mn I3...-0.72+-0.242.47+-0.20-2.96+-0.20-0.77+-0.242.47+-0.20Mn I
Fe43...0.00+-0.225.31+-0.17-2.19+-0.170.00+-0.225.31+-0.17Fe
Co I3...0.09+-0.252.82+-0.21-2.17+-0.210.02+-0.252.82+-0.21Co I
Ni I3...-0.03+-0.244.02+-0.22-2.20+-0.22-0.01+-0.244.02+-0.22Ni I
Sr2...-0.06+-0.290.72+-0.30-2.15+-0.300.04+-0.290.72+-0.30Sr
Y II1...0.11+-0.340.15+-0.34-2.06+-0.340.13+-0.340.15+-0.34Y II
Ba II1...-0.03+-0.28-0.09+-0.26-2.27+-0.26-0.08+-0.28-0.09+-0.26Ba II

Position

Right Ascension : 03 32 07.37 Declination : -39 54 50.2 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 42 N/A 227.0

L.Zhang et al.,AAP, 528, A92, 2011(ADS)

The Hamburg/ESO R-process Enhanced Star survey (HERES). VI. The Galactic chemical evolution of silicon


Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CN/A-2.120.086.40-2.030.176.40C
FeN/A-2.20......-2.20...5.30Fe

Position

Right Ascension : 03 32 07.37 Declination : -39 54 50.2 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 N/A N/A N/A