HE2238-2152

taken from 2 paper(s):

/P.S.Barklem et al.(2005)/ /L.Zhang et al.(2011)/


P.S.Barklem et al.,AAP, 439, 129, 2005(ADS)

The Hamburg/ESO R-process enhanced star survey (HERES). II. Spectroscopic analysis of the survey sample


Stellar Parameters

Teff : 5427 log g : 3.28 vturb : 1.46

Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CH1...0.13+-0.266.12+-0.25-2.31+-0.250.09+-0.266.12+-0.25CH
Mg I6...0.19+-0.235.37+-0.18-2.23+-0.180.17+-0.235.37+-0.18Mg I
Al I1...-1.18+-0.262.89+-0.24-3.56+-0.24-1.16+-0.262.89+-0.24Al I
Ca I7...0.23+-0.254.19+-0.20-2.15+-0.200.25+-0.254.19+-0.20Ca I
Sc II4...-0.07+-0.260.70+-0.23-2.45+-0.23-0.05+-0.260.70+-0.23Sc II
Ti13...0.21+-0.242.82+-0.20-2.13+-0.200.27+-0.242.82+-0.20Ti
Cr I3...-0.32+-0.242.95+-0.24-2.69+-0.24-0.29+-0.242.95+-0.24Cr I
Mn I3...-0.58+-0.242.41+-0.22-3.02+-0.22-0.62+-0.242.41+-0.22Mn I
Fe48...0.00+-0.225.10+-0.18-2.40+-0.180.00+-0.225.10+-0.18Fe
Co I5...0.08+-0.252.60+-0.23-2.39+-0.230.01+-0.252.60+-0.23Co I
Ni I4...-0.17+-0.253.68+-0.25-2.54+-0.25-0.14+-0.253.68+-0.25Ni I
Sr2...-0.29+-0.290.28+-0.29-2.59+-0.29-0.19+-0.290.28+-0.29Sr
Y II2...-0.34+-0.26-0.50+-0.22-2.71+-0.22-0.31+-0.26-0.50+-0.22Y II
Ba II1...-0.37+-0.27-0.64+-0.25-2.82+-0.25-0.42+-0.27-0.64+-0.25Ba II

Position

Right Ascension : 22 41 10.31 Declination : -21 36 19.9 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 48 N/A -22.2

L.Zhang et al.,AAP, 528, A92, 2011(ADS)

The Hamburg/ESO R-process Enhanced Star survey (HERES). VI. The Galactic chemical evolution of silicon


Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CN/A-2.250.156.27-2.160.246.27C
FeN/A-2.40......-2.40...5.10Fe

Position

Right Ascension : 22 41 10.31 Declination : -21 36 19.9 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 N/A N/A N/A