HE2227-4044

taken from 2 paper(s):

/P.S.Barklem et al.(2005)/ /L.Zhang et al.(2011)/


P.S.Barklem et al.,AAP, 439, 129, 2005(ADS)

The Hamburg/ESO R-process enhanced star survey (HERES). II. Spectroscopic analysis of the survey sample


Stellar Parameters

Teff : 5811 log g : 3.85 vturb : 1.40

Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CH1...1.67+-0.267.75+-0.23-0.68+-0.231.64+-0.267.75+-0.23CH
Mg I2...0.30+-0.235.56+-0.18-2.04+-0.180.28+-0.235.56+-0.18Mg I
Al I1...-0.73+-0.253.42+-0.23-3.03+-0.23-0.71+-0.253.42+-0.23Al I
Ca I4...0.39+-0.254.43+-0.21-1.91+-0.210.41+-0.254.43+-0.21Ca I
Sc II2...0.32+-0.261.17+-0.23-1.98+-0.230.34+-0.261.17+-0.23Sc II
Ti8...0.24+-0.242.94+-0.20-2.01+-0.200.31+-0.242.94+-0.20Ti
Cr I1...-0.03+-0.253.33+-0.24-2.31+-0.240.01+-0.253.33+-0.24Cr I
Mn I2...-0.54+-0.242.54+-0.21-2.89+-0.21-0.57+-0.242.54+-0.21Mn I
Fe26...0.00+-0.225.18+-0.17-2.32+-0.170.00+-0.225.18+-0.17Fe
Co I2...0.05+-0.252.65+-0.22-2.34+-0.22-0.02+-0.252.65+-0.22Co I
Ni I3...-0.14+-0.233.79+-0.22-2.43+-0.22-0.11+-0.233.79+-0.22Ni I
Sr2...0.41+-0.251.06+-0.24-1.81+-0.240.51+-0.251.06+-0.24Sr
Ba II1...1.38+-0.241.19+-0.21-0.99+-0.211.33+-0.241.19+-0.21Ba II
La II1...1.28+-0.260.13+-0.23-0.97+-0.231.35+-0.260.13+-0.23La II

Position

Right Ascension : 22 30 19.08 Declination : -40 29 13.1 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 49 N/A 103.9

L.Zhang et al.,AAP, 528, A92, 2011(ADS)

The Hamburg/ESO R-process Enhanced Star survey (HERES). VI. The Galactic chemical evolution of silicon


Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CN/A-0.721.607.80-0.631.697.80C
FeN/A-2.32......-2.32...5.18Fe

Position

Right Ascension : 22 30 19.08 Declination : -40 29 13.1 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 N/A N/A N/A