HE2226-4102

taken from 2 paper(s):

/P.S.Barklem et al.(2005)/ /L.Zhang et al.(2011)/


P.S.Barklem et al.,AAP, 439, 129, 2005(ADS)

The Hamburg/ESO R-process enhanced star survey (HERES). II. Spectroscopic analysis of the survey sample


Stellar Parameters

Teff : 5140 log g : 2.43 vturb : 1.73

Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CH1...0.46+-0.275.98+-0.26-2.45+-0.260.42+-0.275.98+-0.26CH
Mg I6...0.23+-0.244.95+-0.18-2.65+-0.180.22+-0.244.95+-0.18Mg I
Al I1...-1.01+-0.262.60+-0.24-3.85+-0.24-0.98+-0.262.60+-0.24Al I
Ca I7...0.26+-0.253.75+-0.20-2.59+-0.200.28+-0.253.75+-0.20Ca I
Sc II4...0.10+-0.250.40+-0.23-2.75+-0.230.12+-0.250.40+-0.23Sc II
Ti11...0.17+-0.242.33+-0.21-2.62+-0.210.25+-0.242.33+-0.21Ti
Cr I3...-0.32+-0.242.48+-0.24-3.16+-0.24-0.29+-0.242.48+-0.24Cr I
Mn I3...-0.55+-0.231.98+-0.22-3.45+-0.22-0.58+-0.231.98+-0.22Mn I
Fe45...0.00+-0.224.63+-0.19-2.87+-0.190.00+-0.224.63+-0.19Fe
Co I6...0.25+-0.242.30+-0.22-2.69+-0.220.18+-0.242.30+-0.22Co I
Ni I4...-0.11+-0.243.27+-0.24-2.95+-0.24-0.08+-0.243.27+-0.24Ni I
Sr2...-0.06+-0.310.05+-0.33-2.82+-0.330.05+-0.310.05+-0.33Sr
Y II2...-0.15+-0.25-0.77+-0.23-2.98+-0.23-0.11+-0.25-0.77+-0.23Y II
Ba II1...-1.00+-0.25-1.74+-0.23-3.92+-0.23-1.05+-0.25-1.74+-0.23Ba II

Position

Right Ascension : 22 29 04.30 Declination : -40 46 52.4 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 49 N/A 96.0

L.Zhang et al.,AAP, 528, A92, 2011(ADS)

The Hamburg/ESO R-process Enhanced Star survey (HERES). VI. The Galactic chemical evolution of silicon


Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CN/A-2.450.426.07-2.360.516.07C
FeN/A-2.87......-2.87...4.63Fe

Position

Right Ascension : 22 29 04.30 Declination : -40 46 52.4 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 N/A N/A N/A