HE2221-4150

taken from 2 paper(s):

/P.S.Barklem et al.(2005)/ /L.Zhang et al.(2011)/


P.S.Barklem et al.,AAP, 439, 129, 2005(ADS)

The Hamburg/ESO R-process enhanced star survey (HERES). II. Spectroscopic analysis of the survey sample


Stellar Parameters

Teff : 5887 log g : 4.06 vturb : 1.41

Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CH1...0.23+-0.256.59+-0.23-1.84+-0.230.19+-0.256.59+-0.23CH
Mg I4...0.32+-0.235.87+-0.17-1.73+-0.170.30+-0.235.87+-0.17Mg I
Al I1...-1.01+-0.263.43+-0.22-3.02+-0.22-0.99+-0.263.43+-0.22Al I
Ca I8...0.31+-0.244.64+-0.20-1.70+-0.200.33+-0.244.64+-0.20Ca I
Sc II4...0.05+-0.271.19+-0.22-1.96+-0.220.07+-0.271.19+-0.22Sc II
Ti12...0.25+-0.253.24+-0.21-1.71+-0.210.32+-0.253.24+-0.21Ti
Cr I3...-0.16+-0.253.48+-0.23-2.16+-0.23-0.13+-0.253.48+-0.23Cr I
Mn I3...-0.45+-0.242.91+-0.21-2.52+-0.21-0.49+-0.242.91+-0.21Mn I
Fe47...0.00+-0.225.47+-0.17-2.03+-0.170.00+-0.225.47+-0.17Fe
Co I4...0.06+-0.252.95+-0.21-2.04+-0.21-0.01+-0.252.95+-0.21Co I
Ni I3...-0.16+-0.254.06+-0.23-2.16+-0.23-0.13+-0.254.06+-0.23Ni I
Sr2...0.02+-0.270.96+-0.25-1.91+-0.250.12+-0.270.96+-0.25Sr
Y II1...-0.08+-0.270.13+-0.23-2.08+-0.23-0.05+-0.270.13+-0.23Y II
Ba II1...0.09+-0.280.19+-0.24-1.99+-0.240.04+-0.280.19+-0.24Ba II

Position

Right Ascension : 22 24 47.30 Declination : -41 35 38.8 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 53 N/A 40.2

L.Zhang et al.,AAP, 528, A92, 2011(ADS)

The Hamburg/ESO R-process Enhanced Star survey (HERES). VI. The Galactic chemical evolution of silicon


Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CN/A-1.840.196.68-1.750.286.68C
FeN/A-2.03......-2.03...5.47Fe

Position

Right Ascension : 22 24 47.30 Declination : -41 35 38.8 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 N/A N/A N/A