HE1252+0044

taken from 2 paper(s):

/P.S.Barklem et al.(2005)/ /L.Zhang et al.(2011)/


P.S.Barklem et al.,AAP, 439, 129, 2005(ADS)

The Hamburg/ESO R-process enhanced star survey (HERES). II. Spectroscopic analysis of the survey sample


Stellar Parameters

Teff : 5296 log g : 2.98 vturb : 1.57

Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CH1...0.60+-0.285.70+-0.26-2.73+-0.260.55+-0.285.70+-0.26CH
Mg I4...0.51+-0.264.81+-0.20-2.79+-0.200.49+-0.264.81+-0.20Mg I
Al I1...-0.68+-0.252.51+-0.23-3.94+-0.23-0.66+-0.252.51+-0.23Al I
Ca I3...0.48+-0.253.56+-0.20-2.78+-0.200.50+-0.253.56+-0.20Ca I
Sc II1...0.06+-0.25-0.05+-0.24-3.20+-0.240.08+-0.25-0.05+-0.24Sc II
Ti7...0.36+-0.242.10+-0.22-2.85+-0.220.43+-0.242.10+-0.22Ti
Cr I3...-0.28+-0.232.11+-0.20-3.53+-0.20-0.25+-0.232.11+-0.20Cr I
Mn I3...-0.75+-0.241.36+-0.21-4.07+-0.21-0.79+-0.241.36+-0.21Mn I
Fe31...0.00+-0.224.22+-0.19-3.28+-0.190.00+-0.224.22+-0.19Fe
Co I2...0.24+-0.251.88+-0.22-3.11+-0.220.17+-0.251.88+-0.22Co I
Ni I4...0.11+-0.223.08+-0.21-3.14+-0.210.14+-0.223.08+-0.21Ni I
Sr2...0.70+-0.280.39+-0.28-2.48+-0.280.80+-0.280.39+-0.28Sr
Y II2...0.64+-0.25-0.41+-0.24-2.62+-0.240.66+-0.25-0.41+-0.24Y II
Ba II1...-0.53+-0.26-1.68+-0.24-3.86+-0.24-0.58+-0.26-1.68+-0.24Ba II

Position

Right Ascension : 12 55 22.10 Declination : +00 28 01.1 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 44 N/A 395.5

L.Zhang et al.,AAP, 528, A92, 2011(ADS)

The Hamburg/ESO R-process Enhanced Star survey (HERES). VI. The Galactic chemical evolution of silicon


Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CN/A-2.710.575.81-2.620.665.81C
FeN/A-3.28......-3.28...4.22Fe

Position

Right Ascension : 12 55 22.10 Declination : +00 28 01.1 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 N/A N/A N/A