HE1248-1800

taken from 2 paper(s):

/P.S.Barklem et al.(2005)/ /L.Zhang et al.(2011)/


P.S.Barklem et al.,AAP, 439, 129, 2005(ADS)

The Hamburg/ESO R-process enhanced star survey (HERES). II. Spectroscopic analysis of the survey sample


Stellar Parameters

Teff : 5288 log g : 2.92 vturb : 1.47

Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CH1...0.53+-0.276.02+-0.25-2.41+-0.250.48+-0.276.02+-0.25CH
Mg I4...0.27+-0.254.95+-0.20-2.65+-0.200.24+-0.254.95+-0.20Mg I
Al I1...-0.71+-0.272.87+-0.26-3.58+-0.26-0.69+-0.272.87+-0.26Al I
Ca I6...0.24+-0.253.71+-0.20-2.63+-0.200.26+-0.253.71+-0.20Ca I
Sc II3...0.05+-0.250.33+-0.23-2.82+-0.230.07+-0.250.33+-0.23Sc II
Ti10...0.32+-0.232.45+-0.21-2.50+-0.210.39+-0.232.45+-0.21Ti
Cr I3...-0.50+-0.222.28+-0.21-3.36+-0.21-0.47+-0.222.28+-0.21Cr I
Mn I3...-0.67+-0.231.83+-0.21-3.60+-0.21-0.71+-0.231.83+-0.21Mn I
Fe39...0.00+-0.224.61+-0.19-2.89+-0.190.00+-0.224.61+-0.19Fe
Co I5...0.20+-0.242.22+-0.22-2.77+-0.220.12+-0.242.22+-0.22Co I
Ni I4...-0.09+-0.233.27+-0.24-2.95+-0.24-0.06+-0.233.27+-0.24Ni I
Sr2...-0.25+-0.32-0.18+-0.33-3.05+-0.33-0.16+-0.32-0.18+-0.33Sr
Y II1...-0.20+-0.25-0.85+-0.24-3.06+-0.24-0.17+-0.25-0.85+-0.24Y II
Ba II1...-0.12+-0.25-0.89+-0.25-3.07+-0.25-0.18+-0.25-0.89+-0.25Ba II

Position

Right Ascension : 12 51 27.95 Declination : -18 16 30.1 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 43 N/A 280.7

L.Zhang et al.,AAP, 528, A92, 2011(ADS)

The Hamburg/ESO R-process Enhanced Star survey (HERES). VI. The Galactic chemical evolution of silicon


Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CN/A-2.330.566.19-2.240.656.19C
FeN/A-2.89......-2.89...4.61Fe

Position

Right Ascension : 12 51 27.95 Declination : -18 16 30.1 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 N/A N/A N/A