HE1215+0149

taken from 2 paper(s):

/P.S.Barklem et al.(2005)/ /L.Zhang et al.(2011)/


P.S.Barklem et al.,AAP, 439, 129, 2005(ADS)

The Hamburg/ESO R-process enhanced star survey (HERES). II. Spectroscopic analysis of the survey sample


Stellar Parameters

Teff : 5098 log g : 2.37 vturb : 1.48

Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CH1...0.15+-0.285.65+-0.26-2.78+-0.260.12+-0.285.65+-0.26CH
Mg I6...0.35+-0.245.03+-0.19-2.57+-0.190.33+-0.245.03+-0.19Mg I
Al I1...-0.47+-0.293.10+-0.28-3.35+-0.28-0.45+-0.293.10+-0.28Al I
Ca I5...0.27+-0.253.74+-0.20-2.60+-0.200.30+-0.253.74+-0.20Ca I
Sc II4...0.06+-0.260.33+-0.23-2.82+-0.230.08+-0.260.33+-0.23Sc II
Ti12...0.36+-0.242.48+-0.22-2.47+-0.220.43+-0.242.48+-0.22Ti
Cr I2...-0.51+-0.242.27+-0.24-3.37+-0.24-0.47+-0.242.27+-0.24Cr I
Mn I3...-0.72+-0.241.77+-0.22-3.66+-0.22-0.76+-0.241.77+-0.22Mn I
Fe42...0.00+-0.224.60+-0.19-2.90+-0.190.00+-0.224.60+-0.19Fe
Co I5...0.23+-0.252.25+-0.22-2.74+-0.220.16+-0.252.25+-0.22Co I
Ni I4...0.15+-0.273.50+-0.30-2.72+-0.300.18+-0.273.50+-0.30Ni I
Sr2...0.29+-0.290.36+-0.30-2.51+-0.300.39+-0.290.36+-0.30Sr
Y II2...-0.05+-0.26-0.71+-0.24-2.92+-0.24-0.02+-0.26-0.71+-0.24Y II
Ba II1...-0.76+-0.26-1.53+-0.24-3.71+-0.24-0.81+-0.26-1.53+-0.24Ba II

Position

Right Ascension : 12 17 43.14 Declination : +01 32 32.8 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 35 N/A 124.5

L.Zhang et al.,AAP, 528, A92, 2011(ADS)

The Hamburg/ESO R-process Enhanced Star survey (HERES). VI. The Galactic chemical evolution of silicon


Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CN/A-2.660.245.86-2.570.335.86C
FeN/A-2.90......-2.90...4.60Fe

Position

Right Ascension : 12 17 43.14 Declination : +01 32 32.8 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 N/A N/A N/A