HE0436-4008

taken from 2 paper(s):

/P.S.Barklem et al.(2005)/ /L.Zhang et al.(2011)/


P.S.Barklem et al.,AAP, 439, 129, 2005(ADS)

The Hamburg/ESO R-process enhanced star survey (HERES). II. Spectroscopic analysis of the survey sample


Stellar Parameters

Teff : 5431 log g : 3.34 vturb : 1.30

Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CH1...0.49+-0.266.53+-0.25-1.90+-0.250.45+-0.266.53+-0.25CH
Mg I5...0.22+-0.245.45+-0.20-2.15+-0.200.20+-0.245.45+-0.20Mg I
Al I1...-1.18+-0.282.94+-0.25-3.51+-0.25-1.16+-0.282.94+-0.25Al I
Ca I8...0.25+-0.244.26+-0.20-2.08+-0.200.27+-0.244.26+-0.20Ca I
Sc II4...0.05+-0.260.86+-0.23-2.29+-0.230.06+-0.260.86+-0.23Sc II
Ti14...0.30+-0.242.97+-0.21-1.98+-0.210.37+-0.242.97+-0.21Ti
Cr I3...-0.15+-0.253.17+-0.25-2.47+-0.25-0.12+-0.253.17+-0.25Cr I
Mn I3...-0.41+-0.242.63+-0.21-2.80+-0.21-0.45+-0.242.63+-0.21Mn I
Fe49...0.00+-0.225.15+-0.18-2.35+-0.180.00+-0.225.15+-0.18Fe
Co I5...0.18+-0.252.75+-0.22-2.24+-0.220.11+-0.252.75+-0.22Co I
Ni I4...0.07+-0.263.97+-0.27-2.25+-0.270.10+-0.263.97+-0.27Ni I
Sr2...0.33+-0.240.95+-0.22-1.92+-0.220.43+-0.240.95+-0.22Sr
Y II3...0.12+-0.260.01+-0.23-2.20+-0.230.15+-0.260.01+-0.23Y II
Ba II1...-0.26+-0.28-0.48+-0.27-2.66+-0.27-0.31+-0.28-0.48+-0.27Ba II

Position

Right Ascension : 04 38 11.13 Declination : -40 03 01.7 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 40 N/A 185.7

L.Zhang et al.,AAP, 528, A92, 2011(ADS)

The Hamburg/ESO R-process Enhanced Star survey (HERES). VI. The Galactic chemical evolution of silicon


Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CN/A-1.910.446.61-1.820.536.61C
FeN/A-2.35......-2.35...5.15Fe

Position

Right Ascension : 04 38 11.13 Declination : -40 03 01.7 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 N/A N/A N/A