HE0340-3430

taken from 2 paper(s):

/P.S.Barklem et al.(2005)/ /L.Zhang et al.(2011)/


P.S.Barklem et al.,AAP, 439, 129, 2005(ADS)

The Hamburg/ESO R-process enhanced star survey (HERES). II. Spectroscopic analysis of the survey sample


Stellar Parameters

Teff : 5914 log g : 3.81 vturb : 1.59

Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CH1...0.06+-0.266.50+-0.23-1.93+-0.230.02+-0.266.50+-0.23CH
Mg I4...0.19+-0.235.82+-0.18-1.78+-0.180.17+-0.235.82+-0.18Mg I
Al I1...-1.00+-0.263.52+-0.24-2.93+-0.24-0.98+-0.263.52+-0.24Al I
Ca I8...0.36+-0.254.77+-0.20-1.57+-0.200.38+-0.254.77+-0.20Ca I
Sc II3...0.10+-0.251.32+-0.23-1.83+-0.230.12+-0.251.32+-0.23Sc II
Ti13...0.25+-0.243.32+-0.21-1.63+-0.210.32+-0.243.32+-0.21Ti
Cr I3...-0.16+-0.243.56+-0.23-2.08+-0.23-0.13+-0.243.56+-0.23Cr I
Mn I3...-0.50+-0.232.94+-0.21-2.49+-0.21-0.54+-0.232.94+-0.21Mn I
Fe48...0.00+-0.225.55+-0.18-1.95+-0.180.00+-0.225.55+-0.18Fe
Co I4...-0.05+-0.242.92+-0.20-2.07+-0.20-0.12+-0.242.92+-0.20Co I
Ni I3...-0.26+-0.284.04+-0.29-2.18+-0.29-0.23+-0.284.04+-0.29Ni I
Sr2...-0.13+-0.280.89+-0.28-1.98+-0.28-0.03+-0.280.89+-0.28Sr
Y II1...-0.31+-0.29-0.02+-0.28-2.23+-0.28-0.28+-0.29-0.02+-0.28Y II
Ba II1...-0.22+-0.26-0.04+-0.25-2.22+-0.25-0.27+-0.26-0.04+-0.25Ba II

Position

Right Ascension : 03 42 04.78 Declination : -34 20 50.0 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 49 N/A 228.1

L.Zhang et al.,AAP, 528, A92, 2011(ADS)

The Hamburg/ESO R-process Enhanced Star survey (HERES). VI. The Galactic chemical evolution of silicon


Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CN/A-1.730.226.79-1.640.316.79C
FeN/A-1.95......-1.95...5.55Fe

Position

Right Ascension : 03 42 04.78 Declination : -34 20 50.0 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 N/A N/A N/A