HE0109-0742

taken from 2 paper(s):

/P.S.Barklem et al.(2005)/ /L.Zhang et al.(2011)/


P.S.Barklem et al.,AAP, 439, 129, 2005(ADS)

The Hamburg/ESO R-process enhanced star survey (HERES). II. Spectroscopic analysis of the survey sample


Stellar Parameters

Teff : 5315 log g : 1.85 vturb : 2.19

Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CH1...-0.14+-0.305.72+-0.26-2.71+-0.26-0.19+-0.305.72+-0.26CH
Mg I5...0.30+-0.235.36+-0.18-2.24+-0.180.28+-0.235.36+-0.18Mg I
Al I1...-0.94+-0.273.01+-0.25-3.44+-0.25-0.92+-0.273.01+-0.25Al I
Ca I8...0.23+-0.254.07+-0.20-2.27+-0.200.25+-0.254.07+-0.20Ca I
Sc II4...0.03+-0.240.68+-0.23-2.47+-0.230.05+-0.240.68+-0.23Sc II
Ti15...0.21+-0.352.71+-0.37-2.24+-0.370.28+-0.352.71+-0.37Ti
Cr I3...-0.24+-0.242.90+-0.24-2.74+-0.24-0.22+-0.242.90+-0.24Cr I
Mn I3...-0.64+-0.232.23+-0.20-3.20+-0.20-0.68+-0.232.23+-0.20Mn I
Fe47...0.00+-0.224.98+-0.18-2.52+-0.180.00+-0.224.98+-0.18Fe
Co I5...0.12+-0.252.52+-0.21-2.47+-0.210.05+-0.252.52+-0.21Co I
Ni I4...-0.15+-0.243.58+-0.24-2.64+-0.24-0.12+-0.243.58+-0.24Ni I
Sr2...-0.03+-0.300.42+-0.32-2.45+-0.320.07+-0.300.42+-0.32Sr
Y II3...-0.39+-0.25-0.67+-0.23-2.88+-0.23-0.36+-0.25-0.67+-0.23Y II
Ba II1...-0.16+-0.27-0.56+-0.28-2.74+-0.28-0.22+-0.27-0.56+-0.28Ba II

Position

Right Ascension : 01 11 47.07 Declination : -07 26 32.1 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 44 N/A -24.1

L.Zhang et al.,AAP, 528, A92, 2011(ADS)

The Hamburg/ESO R-process Enhanced Star survey (HERES). VI. The Galactic chemical evolution of silicon


Chemical Abundances

Original Data Converted Data Asplund et al. (2009)
Element Nline [X/H] [X/Fe] log-e [X/H] [X/Fe] log-e Element
CN/A-2.55-0.025.97-2.460.075.97C
FeN/A-2.53......-2.53...4.97Fe

Position

Right Ascension : 01 11 47.07 Declination : -07 26 32.1 Galactic Longitude (l) : N/A Galactic Latitude (b) : N/A

Observing Log

Date of Observation JD Facility Resolution S/N Exposure Time Vrad
N/A VLT 20000 N/A N/A N/A